Semiconductor device manufacturing: process – With measuring or testing – Packaging or treatment of packaged semiconductor
Reexamination Certificate
2006-08-08
2006-08-08
Graybill, David E. (Department: 2822)
Semiconductor device manufacturing: process
With measuring or testing
Packaging or treatment of packaged semiconductor
C438S109000, C438S117000, C438S723000, C257SE25006, C257SE25013, C257SE25027
Reexamination Certificate
active
07087442
ABSTRACT:
Process for the formation of a spatial chip arrangement having several chips (32, 36, 37, 38, 39) arranged in several planes and electrically connected to one another, in which the chips are connected via their peripheral connection surfaces (33) to assigned conducting paths (23) of a conducting-path structure (24, 25) arranged on at least one carrier substrate (21, 22) by the chips being arranged transverse to the longitudinal extent of the carrier substrate.
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IBM Technical Disclosure Bulletin, vol. 38, No. 01, pp. 69-70 (Jan. 1995).
IBM Technical Disclosure Bulletin, vol. 38, No. 06, p. 1 (Jun. 1995).
Azdasht Ghassem
Kasulke Paul
Oppermann Hans-Hermann
Zakel Elke
Darby & Darby
Graybill David E.
Pac Tech-Packaging Technologies GmbH
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