Process for the formation of a spatial chip arrangement and...

Semiconductor device manufacturing: process – With measuring or testing – Packaging or treatment of packaged semiconductor

Reexamination Certificate

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C438S109000, C438S117000, C438S723000, C257SE25006, C257SE25013, C257SE25027

Reexamination Certificate

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07087442

ABSTRACT:
Process for the formation of a spatial chip arrangement having several chips (32, 36, 37, 38, 39) arranged in several planes and electrically connected to one another, in which the chips are connected via their peripheral connection surfaces (33) to assigned conducting paths (23) of a conducting-path structure (24, 25) arranged on at least one carrier substrate (21, 22) by the chips being arranged transverse to the longitudinal extent of the carrier substrate.

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IBM Technical Disclosure Bulletin, vol. 38, No. 06, p. 1 (Jun. 1995).

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