Process for the fabrication of thin-film device and...

Etching a substrate: processes – Nongaseous phase etching of substrate – Substrate is multilayered

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C216S103000, C216S104000, C438S747000

Reexamination Certificate

active

10782658

ABSTRACT:
A thin-film device is fabricated by forming a protective layer and a thin-film device layer one by one on a first substrate and bonding a second substrate on the thin-film device layer via a first adhesive layer or a coating layer and first adhesive layer, removing the first substrate at least in a part thereof by etching with a chemical solution, bonding the protective layer, which covers the thin-film device layer on a side of the first substrate, to a third substrate via a second adhesive layer, and removing the second substrate. The protective layer is formed of at least two layers having resistance to the chemical solution used upon removal of the first substrate.

REFERENCES:
patent: 5391257 (1995-02-01), Sullivan et al.
patent: 5472914 (1995-12-01), Martin et al.
patent: 5680190 (1997-10-01), Michibayashi et al.
patent: 6682990 (2004-01-01), Iwane et al.
patent: 6916681 (2005-07-01), Asano et al.
patent: 2001-189460 (2001-07-01), None
patent: 2001-353700 (2001-12-01), None
patent: 2002-184959 (2002-06-01), None
Australian Patent Office Search Report dated Jan. 23, 2006.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Process for the fabrication of thin-film device and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process for the fabrication of thin-film device and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process for the fabrication of thin-film device and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3872774

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.