Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Forming nonplanar surface
Patent
1986-08-07
1988-02-02
Bowers, Jr., Charles L.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Forming nonplanar surface
430197, 430317, 430325, G03F 726, G03C 500
Patent
active
047228830
ABSTRACT:
Fine patterns with high degree of resolution and high resistance to etching can be produced by coating a solution of a photosensitive composition comprising (a) an aromatic azide compound and (b) an alkaline-aqueous-solution-soluble polymer on a substrate, exposing predetermined portions of the coated photosensitive composition to ultraviolet light, developing with an alkaline aqueous solution to form a resist pattern, and etching the substrate using said resist pattern as a mask.
REFERENCES:
patent: 2848328 (1958-08-01), Hepher
patent: 3595656 (1971-07-01), Ruckert et al.
patent: 3869292 (1975-03-01), Peters
patent: 3887373 (1975-06-01), Hays et al.
patent: 4401745 (1983-08-01), Nakane et al.
Isobe Asao
Koibuchi Shigeru
Makino Daisuke
Bowers Jr. Charles L.
Hitachi , Ltd.
LandOfFree
Process for producing fine patterns does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Process for producing fine patterns, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process for producing fine patterns will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1635545