Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – By reaction with substrate
Reexamination Certificate
2006-12-12
2006-12-12
Schillinger, Laura M. (Department: 2813)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
By reaction with substrate
C438S778000, C438S787000
Reexamination Certificate
active
07148153
ABSTRACT:
A process for forming an oxide layer includes forming a first oxide portion over a substrate at a temperature below a threshold temperature. A second oxide portion is formed under the first oxide portion at a temperature above the threshold temperature. The substrate is illustratively oxidizable silicon and the threshold temperature is the viscoelastic temperature of silicon dioxide.
REFERENCES:
patent: 4518630 (1985-05-01), Grasser
patent: 5660895 (1997-08-01), Lee et al.
patent: 5926741 (1999-07-01), Matsuoka et al.
patent: 6066576 (2000-05-01), Thakur et al.
patent: 6149974 (2000-11-01), Nguyen et al.
patent: 6207591 (2001-03-01), Aoki et al.
patent: 6207937 (2001-03-01), Stoddard et al.
patent: 6271152 (2001-08-01), Thakur et al.
patent: 6281141 (2001-08-01), Das et al.
patent: 6521496 (2003-02-01), Roy et al.
patent: 6551946 (2003-04-01), Chen et al.
patent: 2003/0119337 (2003-06-01), Chen et al.
patent: 2003/0143863 (2003-07-01), Chen et al.
patent: 2005/0101155 (2005-05-01), Bang et al.
patent: 2367427 (2002-04-01), None
Wolf, et al. Silicon Processing for the VLSI Era, vol. 1-Process Technology, Lattice Press: Sunset Beach CA, 1986, p. 5.
Chen Yuanning
Chetlur Sundar Srinivasan
Roy Pradip Kumar
Agere Systems Inc.
Schillinger Laura M.
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