Process for manufacturing semiconductor device

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate

Reexamination Certificate

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Details

C438S778000, C438S762000, C438S758000, C438S680000

Reexamination Certificate

active

07576016

ABSTRACT:
An objective of this invention is to solve the problem that in ALD film deposition using a vertical batch processing machine advantageous for improving a throughput, reliability in a dielectric body formed on the bottom of a hole such as a capacitor formed on a semiconductor substrate is reduced as the hole is finer and deeper.A dielectric body is formed by an ALD film deposition process comprising a gas flow sequence where a purging step after supplying a source and a reactant gases is a two-stage purging of vacuum purging and gas purging and the step of supplying a reactant gas is further divided. The process allows a highly reliable dielectric body to be formed in the bottom of a deep hole, contributing to improvement in reliability of a capacitor and a semiconductor device.

REFERENCES:
patent: 6821563 (2004-11-01), Yudovsky
patent: 2007/0269982 (2007-11-01), Rocklein et al.
patent: 2000-54134 (2000-02-01), None
patent: 2001-152339 (2001-06-01), None
patent: 2003-031565 (2003-01-01), None
patent: 2004-23043 (2004-01-01), None
patent: 2004-281824 (2004-10-01), None
patent: 2006-147896 (2006-06-01), None
patent: 2006-161061 (2006-06-01), None
patent: 2007-281407 (2007-10-01), None
patent: 2005-088692 (2005-09-01), None

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