Process for depositing a conductive thin film upon an integrated

Chemistry: electrical and wave energy – Processes and products – Coating – forming or etching by sputtering

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20419212, 20419217, 20429811, C23C 1434

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active

057118582

ABSTRACT:
An improved process for depositing a conductive thin film upon an integrated circuit substrate by collimated sputtering is disclosed. The sputtered films are alloys of aluminum; a preferred alloying metal is magnesium. The sputtered films of the invention have a more uniform orientation of grains than sputtered aluminum copper silicon alloy films. Such processes are especially useful in the fabrication of integrated circuit devices having aluminum alloy wiring elements.

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T. J. Licata, et al., Mat. Res. Soc. Symp. Proc., "The Effect of Collimation on Sputtered AlCuSi and AlMg Microstructures and Electromigration Failure Characteristics", vol. 309, 1993.
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