Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2005-03-22
2005-03-22
Gurley, Lynne A. (Department: 2812)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S685000, C438S686000, C438S687000
Reexamination Certificate
active
06869876
ABSTRACT:
In the present invention, a metal halide film is grown which is then reduced to the metal film rather than growing the metal film directly on the substrate surface. In certain embodiments, a metal halide film is grown from at least two precursors: a halogen-containing precursor and a metal-containing precursor. The metal halide film is then exposed to a reducing agent to form the metal film. In certain preferred embodiments, the metal halide film is exposed to the reducing agent prior to the completion of the growing step.
REFERENCES:
patent: 5306666 (1994-04-01), Izumi
patent: 6368954 (2002-04-01), Lopatin et al.
patent: 6475276 (2002-11-01), Elers et al.
patent: 20010054769 (2001-12-01), Raaijmakers et al.
patent: 20020004293 (2002-01-01), Soininen et al.
patent: 20020106846 (2002-08-01), Seutter et al.
patent: 20020117399 (2002-08-01), Chen et al.
patent: WO 0166832 (2001-09-01), None
Higashi, et al., “Sequential Surface Chemical Reaction Limited Growth of High Quality Al2O3Dielectrics,”Applied Physics Letter, vol. 55, No. 19 (1989), pp. 1963-1965.
S. M. George, et al., “3d Internal Symposium on Atomic Layer Epitaxy and Related Surface Processes,”Applied Surface Science, 82/83 (1994) pp. 460-467.
Per Martensson, et al., “Atomic Layer Epitaxy of Copper,”J. Electrochem. Soc., vol. 145, No. 8, Aug. 1998, pp. 2926-2931.
Raj Solanki, et al., “Atomic Layer Deposition of Copper Seed Layers,”Electrochemical and Solid-State Letters, Vo. 3 (10) (2000), pp. 497-480.
Per Martensson, et al., “Atomic Layer Epitaxy of Copper on Tantalum,”Chem. Vap. Deposition, vol. 3, No. 1 (1997), pp. 45-50.
Park, et al., “Plasma-Enhanced Atomic Layer Deposition of Tantalum Nitrides Using Hydrogen Radicals as a Reducing Agent,”Electrochemical and Solid-State Letters, pp. C17-C19, 2001.
P. Martensson, et al., Atomic Layer Expitaxy of Copper on Tantlalum, Chem. Vap. Deposition (1997), 3, No. 1, pp. 45-50.
European Search Report No. 03025374.4-2119 dated Apr. 23, 2004.
Boze Melanie Anne
Norman John Anthony Thomas
Roberts David Allen
Air Products and Chemicals Inc.
Gurley Lynne A.
Morris-Oskanian Rosaleen P.
LandOfFree
Process for atomic layer deposition of metal films does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Process for atomic layer deposition of metal films, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process for atomic layer deposition of metal films will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3382584