Process for atomic layer deposition of metal films

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S685000, C438S686000, C438S687000

Reexamination Certificate

active

06869876

ABSTRACT:
In the present invention, a metal halide film is grown which is then reduced to the metal film rather than growing the metal film directly on the substrate surface. In certain embodiments, a metal halide film is grown from at least two precursors: a halogen-containing precursor and a metal-containing precursor. The metal halide film is then exposed to a reducing agent to form the metal film. In certain preferred embodiments, the metal halide film is exposed to the reducing agent prior to the completion of the growing step.

REFERENCES:
patent: 5306666 (1994-04-01), Izumi
patent: 6368954 (2002-04-01), Lopatin et al.
patent: 6475276 (2002-11-01), Elers et al.
patent: 20010054769 (2001-12-01), Raaijmakers et al.
patent: 20020004293 (2002-01-01), Soininen et al.
patent: 20020106846 (2002-08-01), Seutter et al.
patent: 20020117399 (2002-08-01), Chen et al.
patent: WO 0166832 (2001-09-01), None
Higashi, et al., “Sequential Surface Chemical Reaction Limited Growth of High Quality Al2O3Dielectrics,”Applied Physics Letter, vol. 55, No. 19 (1989), pp. 1963-1965.
S. M. George, et al., “3d Internal Symposium on Atomic Layer Epitaxy and Related Surface Processes,”Applied Surface Science, 82/83 (1994) pp. 460-467.
Per Martensson, et al., “Atomic Layer Epitaxy of Copper,”J. Electrochem. Soc., vol. 145, No. 8, Aug. 1998, pp. 2926-2931.
Raj Solanki, et al., “Atomic Layer Deposition of Copper Seed Layers,”Electrochemical and Solid-State Letters, Vo. 3 (10) (2000), pp. 497-480.
Per Martensson, et al., “Atomic Layer Epitaxy of Copper on Tantalum,”Chem. Vap. Deposition, vol. 3, No. 1 (1997), pp. 45-50.
Park, et al., “Plasma-Enhanced Atomic Layer Deposition of Tantalum Nitrides Using Hydrogen Radicals as a Reducing Agent,”Electrochemical and Solid-State Letters, pp. C17-C19, 2001.
P. Martensson, et al., Atomic Layer Expitaxy of Copper on Tantlalum, Chem. Vap. Deposition (1997), 3, No. 1, pp. 45-50.
European Search Report No. 03025374.4-2119 dated Apr. 23, 2004.

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