Post passivation interconnection schemes on top of the IC chips

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S127000, C438S618000, C257SE21576

Reexamination Certificate

active

07405150

ABSTRACT:
A new method is provided for the creation of interconnect lines. Fine line interconnects are provided in a first layer of dielectric overlying semiconductor circuits that have been created in or on the surface of a substrate. A layer of passivation is deposited over the layer of dielectric, a thick second layer of dielectric is created over the surface of the layer of passivation. Thick and wide interconnect lines are created in the thick second layer of dielectric. The first layer of dielectric may also be eliminated, creating the wide thick interconnect network on the surface of the layer of passivation that has been deposited over the surface of a substrate.

REFERENCES:
patent: 4670091 (1987-06-01), Thomas et al.
patent: 6040604 (2000-03-01), Lauvray et al.
patent: 6187680 (2001-02-01), Costrini et al.
patent: 6200888 (2001-03-01), Ito et al.
patent: 6229221 (2001-05-01), Kloen et al.
patent: 6232147 (2001-05-01), Matsuki et al.
patent: 6472745 (2002-10-01), Iizuka
patent: 6548365 (2003-04-01), Basteres et al.
patent: 2002/0158334 (2002-10-01), Vu et al.
patent: 1 039 544 (2000-09-01), None
patent: 200216264 (2000-08-01), None
“Influence of the Series of On-Chip Power Supply Buses on Internal Device Failure After ESD Stress”, by H. Terletzki et al., IEEE Trans. on Elec. Devices, vol. 40, No. 11, Nov. 1993, pp. 2081-2083.
“Power Distribution Techniques for VLSI Circuits”, by Song et al., IEEE Jrnl. of Solid-State Circuits, vol. sc-21, No. 1, Feb. 1986, pp. 150-156.
“Processing Thick Multilevel Polyimide Films for 3-D Stacked Memory”, by Caterer et al., IEEE Trans. on Advanced Packaging, vol. 22, No. 2, May 1999, pp. 189-199.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Post passivation interconnection schemes on top of the IC chips does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Post passivation interconnection schemes on top of the IC chips, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Post passivation interconnection schemes on top of the IC chips will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2814358

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.