Positioning device for scanning probe microscopes

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

310328, H01J 3720

Patent

active

053069196

ABSTRACT:
A two dimensional piezoelectric positioning device of the type including a thin walled cylindrical shaped member of piezoelectric material. A plurality of substantially rectangular shaped members are positioned around one surface of the cylindrical shaped member to form opposite pairs of electrodes to control the two dimensional movement in accordance with voltages applied to the pairs of electrodes. Each rectangular shaped member is split into at least two electrode portions and with particular polarity voltages applied to the individual electrode portions to maintain a substantially constant length for the cylindrical shaped member during the two dimensional movement.

REFERENCES:
patent: 3899728 (1975-08-01), Hoppe
patent: 4520570 (1985-06-01), Bednorz et al.
patent: 4871938 (1989-10-01), Elings et al.
patent: 5198715 (1993-03-01), Elings et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Positioning device for scanning probe microscopes does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Positioning device for scanning probe microscopes, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Positioning device for scanning probe microscopes will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1713519

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.