Position microscopy

Details Position microscopy Position microscopy

1991-10-29

1992-10-27

Berman, Jack I.

Radiant energy

Inspection of solids or liquids by charged particles

Positive ion probe or microscope type

250306, 250307, 250308, H01J 3726

Patent

active

051591952

ABSTRACT:
A positron microscope utilizes a time-of-flight adjustment and a beam gate to distinguish images produced by respective types of positronium events. If the time-of-flight of secondary electrons is approximately between 30 and 40 ns, then the electron image will represent prompt annihilations and parapositronium distributions in the target. For time-of-flight between 50 and 100 ns longer than the processing time of the electronic gating circuitry, the electron image will be a map of long-lived orthopositronium events.

REFERENCES:
patent: 4740694 (1988-04-01), Nishimura et al.
patent: 4864131 (1989-09-01), Rich et al.
patent: 5063293 (1991-11-01), Rich et al.

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