Portable electron microscope using micro-column

Radiant energy – Inspection of solids or liquids by charged particles – Electron microscope type

Reexamination Certificate

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Details

C250S306000, C250S307000, C250S310000, C250S492100, C250S492300

Reexamination Certificate

active

08071944

ABSTRACT:
Provided is a portable electron microscope using a microcolumn. The portable electron microscope includes a microcolumn, a low vacuum pump, a high vacuum pump, an ultra-high vacuum ion pump, a first chamber for receiving and fixing the microcolumn and a sample to be measured and forming a vacuum by means of the pumps, a controller, and a case for receiving the pumps, the chamber and the controller.

REFERENCES:
patent: 4663559 (1987-05-01), Christensen
patent: 5248636 (1993-09-01), Davis et al.
patent: 5412180 (1995-05-01), Coombs, III
patent: 6023060 (2000-02-01), Chang et al.
patent: 6369385 (2002-04-01), Muray et al.
patent: 6451120 (2002-09-01), Hubbard et al.
patent: 7329878 (2008-02-01), Kim
patent: 2003/0010911 (2003-01-01), Palmer et al.
patent: 2004/0144922 (2004-07-01), Hayashibara et al.
patent: 2004/0207424 (2004-10-01), Hollman
patent: 2004/0262541 (2004-12-01), Honda et al.
patent: 2005/0178966 (2005-08-01), Gross
patent: 2006/0193037 (2006-08-01), Strait

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