Polishing method, polishing apparatus, and method of...

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means

Reexamination Certificate

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C438S691000, C438S692000

Reexamination Certificate

active

07141501

ABSTRACT:
A polishing method and a polishing apparatus by which excess portions of a metallic film18can be removed easily and efficiently in planarizing the metallic film18by polishing and which is high in accuracy of polishing, are provided. Also, a method of manufacturing a semiconductor device by use of the polishing method and the polishing apparatus is provided. A substrate17provided with the metallic film18and a counter electrode15are disposed oppositely to each other in an electrolytic solution E, an electric current is passed to the metallic film18through the electrolytic solution E, and the surface of the metallic film18is polished with a hard pad14.

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