Static information storage and retrieval – Read/write circuit – Having particular data buffer or latch
Reexamination Certificate
2000-12-20
2003-04-29
Nelms, David (Department: 2818)
Static information storage and retrieval
Read/write circuit
Having particular data buffer or latch
C365S230030, C365S230080
Reexamination Certificate
active
06556484
ABSTRACT:
BACKGROUND OF THE INVENTION
The present invention relates to a plural line buffer type memory LSI, and more specifically to a plural line buffer type memory LSI including a plurality of line buffers added to a memory section so as to be able to effectively reduce a memory access delay.
As a technology for elevating the performance of a memory LSI, attention has been focused on a plural line buffer type memory LSI. This plural line buffer type memory LSI is so configured that a plural line buffer section composed of a plurality of line buffers is provided adjacent to a memory section within a memory LSI, and a portion of data stored in the * memory section is prefetched in the plural line buffer section (data is previously read out). This plural line buffer type memory LSI is required to effectively reduce a delay time in a memory access, in order to realize a high speed access.
As a typical example of the above mentioned plural line buffer type memory LSI, a Virtual Channel Memory (VCM) architecture reported by NEC Corporation is already known. This VCM architecture is actually incorporated in a commercially available 128M-bit DRAM, and is disclosed in a 128M-bit Virtual Channel SDRAM Data Sheet available from NEC Corporation.
FIG. 19
briefly illustrates a circuit block of the 128M-bit VC-SDRAM. This 128M-bit VC-SDRAM will be called a “Prior Art” 1 in this specification. In this Prior Art 1, a line buffer is called a channel. As well known, a memory section
107
in the DRAM is activated in units of page, and the activated page is read out to a sense amplifier part
112
within the memory section
107
. In the case of a conventional DRAM (called a “page type memory LSI” hereinafter), data is read out in units of word, from the activated page (read out to the sense amplifier part). (The page type memory LSI is exemplified by SDRAM, and its detail is disclosed in a 128M-bit SDRAM Data Sheet available from NEC Corporation.) Differently from this SDRAM, the VC-SDRAM of the Prior Art 1 is characterized in that data of a portion called a segment, in the activated page, is read and written at a time between the memory section and a plural line buffer section
108
. In the Prior Art 1, here, the size of the page, the segment and the word are 8 kbits, 2 kbits and 16 bits, respectively, and the number of the line buffers is 16.
FIG. 20
shows a truth table of commands used in the Prior Art 1. Here, a bank address, a row address, a segment address (indicating a segment within a page), a column address, and a line buffer number are 1 bit, 14 bits, 2 bits, 9 bits and 4 bits, respectively.
As shown in detail in
FIGS. 19 and 20
, the memory access in the Prior Art 1 is realized by two steps of a background operation and a foreground operation. The background operation is a processing required for a data transfer in units of segment, performed between the memory section
107
and the plural line buffer section
108
. The foreground operation is a data transfer processing in units of word, performed between the plural line buffer section
108
and a data input/output terminal group of a data buffer. The background operation mainly includes four kinds of operation, which are a page open operation for activating a page to read out data to the sense amplifier part
112
(ACT instruction), a prefetch operation for reading a desired segment from the (activated) page read to the sense amplifier part
112
in tie memory section
107
, to the plural line buffer section
108
(PFC instruction), a restore operation for writing back a segment into the (activated) page in tie memory section
107
read to the sense amplifier part
112
(RST instruction), and a page close operation for closing the activated page to be ready to activate another page (PRE instruction). On the other hand, the foreground operation mainly includes two kinds of operation, which are a buffer read operation for reading a word from a desired line buffer
115
within the plural line buffer section
108
(READ instruction) and a buffer write operation for writing a word into a desired line buffer
115
(WRITE instruction). In the Prior Art 1, incidentally, the plural line buffer section
108
are constituted to be full-associative. This means that it is possible to read out a segment at an arbitrary position to an arbitrary line buffer
115
.
In the plural line buffer type memory LSI, since it is necessary to designate the line buffer
115
, it is necessary to increase the number of input/output terminals or alternatively to use a plurality of commends, in comparison with the page type memory LSI which uses no line buffer
115
. In order to ensure compatibility with input/output terminals of the page type memory LSI, the Prior Art 1 is so configured to designate the line buffer by use of the latter means.
FIG. 21
illustrates a procedure for reading out the data from the memory section
107
to the data input/output terminals in the Prior Art 1. This procedure is carried out by the following three operations: (1) First, a page is designated by a bank address and a row address, and the designated page is activated and held by the sense amplifier part (ACT instruction). (2) Next, a segment is designated from the page held in the sense amplifier part, by the bank address and the row address, and the designated segment is written into the line buffer
115
designated by the line buffer number (PFC instruction). (3) Finally, the line buffer is designated by the line buffer number, and a word designated by a column address is read out from the designated line buffer (READ instruction).
In the page type memory LSI which uses no line buffer
115
, since it is unnecessary to designate the line buffer, the PFC instruction is not necessary. Therefore, the plural line buffer type memory LSI has an increased delay time in a memory access in comparison with the page type memory LSI, since the commands have increased, in the case that there is a restriction in an interval for issuing the commands. In addition, as shown in
FIG. 21
, the Prior Art 1 is required to decode again the bank address already decoded by the ACT instruction when the PFC instruction is received, and similarly to decode again the line buffer address already decoded by the PFC instruction when the READ instruction is received. In the Prior Art 1, therefore, a reduplicate operation is necessary, so that the delay time in the memory access becomes large.
Therefore, the plural line buffer type memory LSI is desired to reduce the delay time in the memory access attributable to the restriction in connection with the issue of the commands, while maintaining the compatibility with the input/output terminals of the page type memory LSI and suppressing the increase in the number of input/output terminals.
BRIEF SUMMARY OF THE INVENTION
Accordingly, it is an object of the present invention to provide a plural line buffer type memory LSI capable of reducing the delay time in the memory access attributable to the restriction in connection with the issue of the commands.
Another object of the present invention is to provide a plural line buffer type memory LSI capable of reducing the delay time in the memory access attributable to the restriction in connection with the issue of the commands, while maintaining the compatibility in input/output terminals or suppressing the increase in the number of input/output terminals.
The means for achieving the above objects can be defined as follows. Technical matters described in the following are suffixed with parenthesized reference numbers and signs. Those reference numbers and signs correspond to the reference numbers or signs given, to technical matters in at least one embodiment or a plurality of examples of a plurality of embodiments or examples of the present invention, in particular, technical matters shown in a drawing showing that embodiment or example. Those reference numbers and signs are given to clarify the correspondence between the technical matters defined in the claims and the technical matters of the embodiments and/or examples
Motomura Masato
Yabe Yoshikazu
Auduong Gene N.
NEC Corporation
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