Electricity: measuring and testing – Testing potential in specific environment – Voltage probe
Reexamination Certificate
2005-05-10
2005-05-10
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Testing potential in specific environment
Voltage probe
C324S754090, C029S854000
Reexamination Certificate
active
06891360
ABSTRACT:
A plated test probe structure for testing electrical connections to integrated circuits (IC) devices with solder bumped interconnection pads that are an integral part of the fan-out wiring on the test substrate, or other printed wiring device.
REFERENCES:
patent: 5450290 (1995-09-01), Boyko et al.
patent: 5665650 (1997-09-01), Lauffer et al.
patent: 5785538 (1998-07-01), Beaman et al.
patent: 5811982 (1998-09-01), Beaman et al.
Beaman Brian Samuel
Fogel Keith Edward
Lauro Paul Alfred
O'Sullivan Eugene John
Shih Da-Yuan
Beck Thomas A.
Morris Daniel P.
Nguyen Vincent Q.
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