Plasma processing apparatus

Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – With microwave gas energizing means

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118723R, 118715, C23F 102, C23C 1600

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active

061561517

ABSTRACT:
A plasma etching apparatus has a central processing chamber, an upper exhaust chamber thereabove, and a lower exhaust chamber therebelow. The processing chamber, the upper exhaust chamber, and the lower exhaust chamber are airtightly formed by a central casing part, an upper casing part, and a lower casing part which are separably combined. The upper and lower exhaust chambers are respectively connected to upper and lower exhaust pumps. A susceptor having a support surface for supporting a target object, and an upper electrode or shower head opposing it are arranged in the processing chamber. A processing gas spouted through the shower head flows upward and downward toward the upper and lower exhaust chambers via the processing chamber.

REFERENCES:
patent: 5209803 (1993-05-01), Powell
patent: 5242539 (1993-09-01), Kumihashi et al.
patent: 5389197 (1995-02-01), Ishimaru
patent: 5523261 (1996-06-01), Sandhu
patent: 5525159 (1996-06-01), Hama et al.
patent: 5779803 (1998-07-01), Kuruno
patent: 5916454 (1999-06-01), Richardson et al.
Kazunori Tsujimoto, et al., Journal of Vacuum Science and Technology: Part A, vol. 12, No. 4, pp. 1209-1215, Jul./Aug. 1994, "Short-Gas-Residence-Time-Electron Cyclotron Resonance Plasma Etching".

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