Plasma-enhanced chemical vapor deposition (CVD) method to...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S637000

Reexamination Certificate

active

06362098

ABSTRACT:

FIELD OF THE INVENTION
The present invention generally relates to semiconductor manufacturing, and, more particularly, to chemical vapor deposition (CVD).
BACKGROUND OF THE INVENTION
Electronic circuits are manufactured from semiconductor substrates (“wafers”) that are processed in a variety of steps such as, for example, lithography, etching, CVD, chemical-mechanical polishing (CMP). In some processing steps, dielectric material is deposited into trenches at the substrate surface. There is a continuous desire to perform the deposition uniform and free of so-called voids. The present invention seeks to provide an improved deposition method.


REFERENCES:
patent: 5182221 (1993-01-01), Sato
patent: 5824562 (1998-10-01), Park
patent: 6009827 (2000-01-01), Robles et al.
patent: 6051114 (2000-04-01), Yao et al.
patent: 6136211 (2000-10-01), Qian et al.
patent: 6270862 (2001-08-01), McMillin et al.
patent: 0856884 (1998-08-01), None
patent: 0936665 (1999-08-01), None
patent: WO 99/62108 (1999-12-01), None
patent: WO 00/03425 (2000-01-01), None

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