Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive...
Patent
1978-09-05
1980-12-23
Welsh, John D.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
156643, 156644, 430312, 430313, 430314, 430300, 430306, 430325, 430326, 430329, 430330, 430435, G03C 524
Patent
active
042411653
ABSTRACT:
After exposure to radiation photoresist may be developed by a dry process using a gas plasma, preferably an oxygen plasma. The process can be used for chemical milling, photolithography, printed circuit board and photomask manufacture and it is particularly advantageous in the manufacture of semiconductors. The plasma development process can be followed by plasma etch and strip processes without requiring removal of the work piece from the plasma reactor.
REFERENCES:
patent: 3705055 (1972-12-01), Christensen et al.
patent: 3920483 (1975-11-01), Johnson, Jr. et al.
patent: 3997367 (1976-12-01), Yau
patent: 4056395 (1977-11-01), Sato et al.
Hollohan et al., Techniques and Applications of Plasma Chemistry, Wiley & Sons, (1975), pp. 350-355.
Hughes Henry G.
Keller Jed V.
Motorola Inc.
Mueller Foorman L.
Rauner Vincent J.
Welsh John D.
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