Plasma deposition of amorphous semiconductors at microwave...

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor

Reexamination Certificate

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C438S485000, C438S772000, C438S777000, C257SE21297

Reexamination Certificate

active

08048782

ABSTRACT:
Apparatus and method for plasma deposition of thin film photovoltaic materials at microwave frequencies. The apparatus avoids deposition on windows or other microwave transmission elements that couple microwave energy to deposition species. The apparatus includes a microwave applicator with conduits passing therethrough that carry deposition species. The applicator transfers microwave energy to the deposition species to transform them to a reactive state conducive to formation of a thin film material. The conduits physically isolate deposition species that would react to form a thin film material at the point of microwave power transfer. The deposition species are separately energized and swept away from the point of power transfer to prevent thin film deposition. The invention allows for the ultrafast formation of silicon-containing amorphous semiconductors that exhibit high mobility, low porosity, little or no Staebler-Wronski degradation, and low defect concentration.

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patent: 4504518 (1985-03-01), Ovshinsky
patent: 4517223 (1985-05-01), Ovshinsky
patent: 4521447 (1985-06-01), Ovshinsky
patent: 4605941 (1986-08-01), Ovshinsky
patent: 4839312 (1989-06-01), Ovsinsky
patent: 5103284 (1992-04-01), Ovshinsky
patent: 5324553 (1994-06-01), Ovshinsky
patent: 2011/0033638 (2011-02-01), Ponnekanti et al.

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