PICA system timing measurement and calibration

Error detection/correction and fault detection/recovery – Pulse or data error handling – Skew detection correction

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C368S120000, C324S601000

Reexamination Certificate

active

10974464

ABSTRACT:
PICA probe system apparatus is described, including apparatus for calibrating an event timer having a coarse measurement capability in which time intervals defined by clock boundaries are counted and a fine measurement capability in which time between boundaries is interpolated using a voltage ramp.

REFERENCES:
patent: 4637733 (1987-01-01), Charles et al.
patent: 5057771 (1991-10-01), Pepper
patent: 5270643 (1993-12-01), Richardson et al.
patent: 5900755 (1999-05-01), Toeppen et al.
patent: 5940545 (1999-08-01), Kash et al.
patent: 6028952 (2000-02-01), Kash et al.
patent: 6172512 (2001-01-01), Evans et al.
patent: 6657446 (2003-12-01), Goruganthu et al.
patent: 6819117 (2004-11-01), Wilsher
patent: 0 937 989 (1999-08-01), None
US 6,304,668, 10/2001, Evans et al. (withdrawn)
D. Porat,Review of Sub-Nanosecond Timer-Interval Measurements, IEEE Transactions on Nuclear Science, vol. NS-20, No. 5, 1973, pp. 36-51.
M. Fahmie,A System for Providing High Quality Triggers to Experimental Areas, Proceedings of the Particle Accelerator Conference1999, Mar. 27, 1999, pp. 756-758.
J. Bude,Hot-carrier luminescence in Si, Phys. Rev. B, 45(11), Mar. 15, 1992, pp. 5848-5856.
S. Villa et al.,Photon emission from hot electrons in silicon, Phys. Rev. B, 52(15), Oct. 15, 1995-I, pp. 10993-10999.
J. Kash et al.,Full Chip Optical Imaging of Logic State Evolution in CMOS Circuits, IEDM 96 Late News Paper (1996) 1, pp. 934-936.
D. Knebel et al.,Diagnosis and Characterization of Timing-Related Defects by Time-Dependent Light Emission, ITC PROCEEDINGS 1998.
M. Bruce et al.,Waveform Acquisition from the Backside of Silicon Using Electro-Optic Probing, Proceedings From the 25thInternational Symposium for Testing and Failure Analysis, Nov. 14-18, 1999, pp. 19-25.
T. Eiles et al.,Optical Probing of VLSI IC's from the Silicon Backside, Proceedings From the 25THInternational Symposium for Testing and Failure Analysis, Nov. 14-18, 1999, pp. 27-33.
M. McManus,Picosecond Imaging Circuit Analysis of the IBM G6 Microprocessor Cache, Proceedings From the 25THInternational Symposium for Testing and Failure Analysis, Nov. 14-18, 1999, pp. 35-38.
N. Goldblatt et al.,Unique and Practical IC Timing Analysis Tool Utilizing Intrinsic Photon Emission, Microelectronics Reliability 41 (2001) 1507-1512.
G. Dajee et al.,Practical, Non-Invasive Optical Probing for Flip-Chip Devices, ITC Paper 15.3 (Baltimore, Oct. 28-Nov. 2, 2001) 433-442.
IDS® PICA, Advanced Optical Imaging for Analysis for 0.13-micron and SOI Devices, Schlumberger Semiconductor Solutions brochure printed Mar. 2001, four pages.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

PICA system timing measurement and calibration does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with PICA system timing measurement and calibration, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and PICA system timing measurement and calibration will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3856599

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.