Electronic digital logic circuitry – Signal sensitivity or transmission integrity – Signal level or switching threshold stabilization
Reexamination Certificate
2006-09-26
2006-09-26
Tan, Vibol (Department: 2819)
Electronic digital logic circuitry
Signal sensitivity or transmission integrity
Signal level or switching threshold stabilization
C326S033000, C326S034000, C327S530000, C327S534000, C327S157000
Reexamination Certificate
active
07112990
ABSTRACT:
Improvements to the physical layer are provided, for example a test circuit that does not introduce further skew into critical clock signals. A boundary scan test circuit is also provided used to isolate an integrated circuit for applying test vectors or circuit brand connections to test the integrity thereof. A bias voltage generator for a voltage controlled delay line (VCDL) is also provided.
REFERENCES:
patent: 5184129 (1993-02-01), Fung et al.
patent: 6462588 (2002-10-01), Lau et al.
patent: 6573779 (2003-06-01), Sidiropoulos et al.
Alexeyev Alexander
Reynolds David
Richard Maurice
Waldstein Steven M.
Blakely , Sokoloff, Taylor & Zafman LLP
Tan Vibol
Tundra Semiconductor Corp.
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