Photomask for forming photoresist patterns repeating in two...

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

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Reexamination Certificate

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07361433

ABSTRACT:
A photomask includes a transparent substrate, and a plurality of light-shielding patterns repeatedly aligned on the transparent substrate in two dimensions. Each of the light-shielding patterns has length and width measurements that differ from each other. Further, the photomask includes at least one through hole penetrating a portion of each of the light-shielding patterns to expose the transparent substrate.

REFERENCES:
patent: 5935734 (1999-08-01), Pierrat
patent: 6830852 (2004-12-01), Kawata et al.
patent: 6991896 (2006-01-01), Kawashima
patent: 7022438 (2006-04-01), Kim

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