Photoacid generators and lithographic resists comprising the...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C430S921000, C430S925000, C430S919000, C568S028000, C568S030000, C568S031000, C568S032000, C568S033000, C568S034000, C568S035000, C568S074000, C568S075000, C568S077000, C522S031000, C526S243000, C526S245000, C526S247000, C526S248000, C526S287000, C526S288000

Reexamination Certificate

active

07833690

ABSTRACT:
The present invention relates to photoacid generating compounds, lithographic resists comprising photoacid generating compounds, and to various lithographic processes techniques, and applications. In one embodiment, the present invention provides a photoacid generator of Formula (I):

REFERENCES:
patent: 5945250 (1999-08-01), Aoai et al.
patent: 6869748 (2005-03-01), Takeda et al.
patent: 2002/0051928 (2002-05-01), Zampini
patent: 2004/0029037 (2004-02-01), Kamabuchi et al.
patent: 2004/0229161 (2004-11-01), Yasunami et al.
patent: 2005/0208419 (2005-09-01), Inabe et al.
patent: 2006/0121390 (2006-06-01), Gonsalves
patent: 10-221852 (1998-08-01), None
patent: 11-167199 (1999-06-01), None
patent: 2003-322972 (2003-11-01), None
patent: 2006-178317 (2006-07-01), None
English abstract for JP 10-221852 provided by JPO.
Machine-assisted English translation for JP 10-221852 provided by JPO.
Wang et al (“Novel Anionic Photoacid Generators (PAGs) and Corresponding PAG Bound Polymers”, Macromolecular Rapid Communications, 2006, vol. 27, issue 18 (date Sep. 22, 2006).
Machine-assisted English translation of JP2006-178317 provided by JPO.
English abstract of JP2003-322972 provided by JPO.
English abstract of JP11-167199 provided by JPO.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Photoacid generators and lithographic resists comprising the... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Photoacid generators and lithographic resists comprising the..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Photoacid generators and lithographic resists comprising the... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4186545

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.