Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-09-13
2005-09-13
Nelms, David (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S002000, C257S003000, C257S004000, C315S101000, C315S105000, C315S163000, C365S101000, C365S102000, C365S103000, C365S104000, C365S105000, C365S163000
Reexamination Certificate
active
06943395
ABSTRACT:
A phase random access memory including a plurality of access transistors, each access transistor including a drain region, and a phase-changeable film shared by the plurality of access transistors. The phase-changeable film is connected to a bitline through a first electrode and connected to each respective drain region through at least one of a plurality of second electrodes.
REFERENCES:
patent: 6750469 (2004-06-01), Ichihara et al.
Cho Beak-Hyung
Cho Woo-Yeong
Kim Du-Eung
Oh Hyung-Rok
F. Chau & Associates LLC
Nelms David
Samsung Electronics Co,. Ltd.
Tran Mai-Huong
LandOfFree
Phase random access memory with high density does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Phase random access memory with high density, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Phase random access memory with high density will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3379710