Phase locked loops capable of burn-in testing with increased...

Details Phase locked loops capable of burn-in testing with increased... Phase locked loops capable of burn-in testing with increased...

2007-07-03

2010-11-02

Tran, Khanh C (Department: 2611)

Pulse or digital communications

Synchronizers

Phase displacement, slip or jitter correction

C327S147000

Reexamination Certificate

active

07826584

ABSTRACT:
In phase locked loop, a phase detector detects a phase difference between a first clock signal and a second clock signal and output a first output signal based on the detected difference. A charge pump generates a control voltage in response to the first output signal from the phase detector. A voltage-controlled oscillator generates the second clock signal. A controller controls the control voltage such that the phase difference between the first clock signal and the second clock signal is increased in response to a burn-in test mode signal.

REFERENCES:
patent: 5926515 (1999-07-01), Park
patent: 5982189 (1999-11-01), Motika et al.
patent: 6262634 (2001-07-01), Flanagan et al.
patent: 6384649 (2002-05-01), Boerstler et al.
patent: 1 152 536 (2001-11-01), None

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