Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2008-07-08
2008-07-08
Ngo, Ngan (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S537000, C257SE27120
Reexamination Certificate
active
07397092
ABSTRACT:
A phase-changeable memory device may include a substrate, an insulating layer on the substrate, first and second electrodes, and a pattern of a phase-changeable material between the first and second electrodes. More particularly, the insulating layer may have a hole therein, and the first electrode may be in the hole in the insulating layer. Moreover, portions of the second electrode may extend beyond an edge of the pattern of phase-changeable material. Related methods are also discussed.
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Korean Notice to File a Response/Amendment to the Examination Report for Korean Application No. 2003-17694 mailed on May 30, 2005.
Horii Hideki
Joo Suk-ho
Yi Ji-hye
Myers Bigel Sibley & Sajovec P.A.
Ngo Ngan
Samsung Electronics Co,. Ltd.
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