Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Forming nonplanar surface
Patent
1996-11-04
1999-07-27
Chu, John S.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Forming nonplanar surface
430313, 430325, 430330, G03F 736, G03F 740
Patent
active
059288400
ABSTRACT:
A patterning material includes a polymer represented by a general formula: ##STR1## wherein R.sub.1 indicates a hydrogen atom or an alkyl group; R.sub.2 indicates a hydrophobic protecting group which is easily desorbed through a function of an acid; R.sub.3 indicates a hydrogen atom or an alkyl group; R.sub.4 and R.sub.5 independently indicate a hydrogen atom, an alkyl group, a phenyl group or an alkenyl group, or together indicate a cyclic alkyl group, a cyclic alkenyl group or a cyclic alkyl or alkenyl group having a phenyl group; x satisfies a relationship of 0<x<1; and y satisfies a relationship of 0<y<1.
REFERENCES:
patent: 4869995 (1989-09-01), Shirai et al.
patent: 5066566 (1991-11-01), Novembre
patent: 5278029 (1994-01-01), Shirai et al.
patent: 5658711 (1997-08-01), Matsuo et al.
patent: 5741628 (1998-04-01), Matsuo et al.
Endo Masayuki
Matsuo Takahiro
Shirai Masamitsu
Tsunooka Masahiro
Chu John S.
Matsushita Electric - Industrial Co., Ltd.
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