Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Forming nonplanar surface
Patent
1995-06-07
1997-09-23
Chu, John S.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Forming nonplanar surface
430170, 4302701, 430330, 430907, 430909, 430942, G03F 730, G03F 7004
Patent
active
056702990
ABSTRACT:
A resist composition comprising (a) a polymer having at least repeating units of the formulae: ##STR1## (b) a photoacid generator and (c) a solvent, has high sensitivity to light, excellent heat resistance, adhesiveness to a substrate and suitable for pattern formation with high resolution.
REFERENCES:
patent: 3100804 (1963-08-01), Abramo
patent: 3798034 (1974-03-01), Laridon
patent: 3847610 (1974-11-01), Laridon et al.
patent: 4101323 (1978-07-01), Buhr et al.
patent: 4491628 (1985-01-01), Ito et al.
patent: 4601969 (1986-07-01), Clecak et al.
patent: 4603101 (1986-07-01), Crivello
patent: 4678737 (1987-07-01), Schneller et al.
patent: 4828958 (1989-05-01), Hayase et al.
patent: 5110709 (1992-05-01), Aoai et al.
patent: 5130392 (1992-07-01), Schwalm et al.
patent: 5135838 (1992-08-01), Houlihan et al.
patent: 5151341 (1992-09-01), Kim
patent: 5343885 (1994-09-01), Reardon
patent: 5350660 (1994-09-01), Urano et al.
patent: 5403695 (1995-04-01), Hayase et al.
Patent Abstracts of Japan, vol. 14, No. 415 (P-1102) 7 Sep. 1990 of JP-A-2 161 436 (Oki Electric Ind Co Ltd) 21 Jun. 1990.
Reichmanis et al., Chemistry and Processes for Deep-UV Resists, Microelectric Engineering, vol. 13, No. 1/4, pp. 3-10, Mar., 1991, Amsterdam NL.
Polymer Bulletin 29 (1988), pp. 427-434.
Polymer Material Sci. Eng., 61 (1989), pp. 412-416.
Polymer Engineering and Science, Dec. 1983, vol.23, No. 18, pp. 1012-1018.
SPIE vol. 1262 Advances in Resist Technology and Processing VII (1990), pp. 8-15.
SPIE vol. 1262 Advances in Resist Technology and Processing VII (1990), pp. 16-25.
J. Vac. Sci. Technol. B 9 (2), Mar./Apr. 191, pp. 278-289.
SPIE vol. 1086 Advances in Resist Technology and Processing VI (1989), pp. 22-33.
SPIE vol. 1086 Advances in Resist Technology and Processing VI (1989), pp. 357-362.
SPIE vol. 1086 Advances in Resist Technology and Processing VI (1989), pp. 2-10.
Fujie Hirotoshi
Negishi Takaaki
Oono Keiji
Urano Fumiyoshi
Chu John S.
Wako Pure Chemical Industries Ltd.
LandOfFree
Pattern formation process does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Pattern formation process, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Pattern formation process will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1938203