Partial vacuum boron diffusion process

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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156614, C30B 2502

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active

043812139

ABSTRACT:
A method is presented for the uniform and reproducible boron doping of many closely spaced silicon wafers in a single batch, wherein a particular process sequence and specified ranges of reactant gas compositions, flow rate and pressure are utilized. The method is illustrated for BCl.sub.3 as a boron source gas and H.sub.2 and O.sub.2 as an oxidant gas. Superior results are obtained when BCl.sub.3 and H.sub.2 O are present in the reaction chamber at pressures less than 10 Torr (1.3 kPa) and molar ratios are in a specific range close to but not equal to that necessary for stoichiometric production of B.sub.2 O.sub.3.

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Busen et al., "Ellipsomeric Investigations", published in J. of Electrochem. Soc.: Solid State Science, Mar. 1968, pp. 291-294.
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Runyan, "Silicon Semiconductor Technology", McGraw-Hill Book Co., 1965, pp. 146-148.
Negrini et al., "Boron Predeposition in Silicon", published in J. of Electrochem. Soc.: Solid-State Science and Tech., Apr. 1978, pp. 609-613.

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