Parameter linking system for data visualization in...

Details Parameter linking system for data visualization in... Parameter linking system for data visualization in...

2006-11-28

2006-11-28

Lin, Sun James (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000

Reexamination Certificate

active

07143370

ABSTRACT:
A system for presenting tester information is provided, including providing test data of a first parameter and generating a first type of visualization of the first parameter and presenting the first type of visualization of the first parameter. The system includes generating a second type of visualization of the first parameter in response to the presenting of the first type of visualization of the first parameter and presenting the second type of visualization of the first parameter.

REFERENCES:
patent: 6542830 (2003-04-01), Mizuno et al.
patent: 2004/0002829 (2004-01-01), Iguchi et al.

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