Parallel test circuit for semiconductor memory

Details Parallel test circuit for semiconductor memory Parallel test circuit for semiconductor memory

1998-12-17

2000-02-15

Nelms, David

Static information storage and retrieval

Read/write circuit

Testing

36523008, G11C 700

Patent

active

060260394

ABSTRACT:
A parallel test circuit for a semiconductor memory device includes multiple data input pads, multiple data input buffers respectively connected to the data input pads for receiving write data in response to a chip selection signal during normal operation, and a switching circuit for electrically connecting the data input pads to each other in response to a current leakage test signal applied to the circuit. The circuit enables the detection of leakage current in the input data buffers at the same time that a parallel data writing test is performed, thereby reducing the total time required to test the device.

REFERENCES:
patent: 5559744 (1996-09-01), Kuriyama et al.

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