Packaging microelectromechanical structures

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With window means

Reexamination Certificate

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C257S724000, C257S778000

Reexamination Certificate

active

06903452

ABSTRACT:
A microelectromechanical system may be enclosed in a hermetic cavity defined by joined, first and second semiconductor structures. The joined structures may be sealed by a solder sealing ring, which extends completely around the cavity. One of the semiconductor structures may have the system formed thereon and an open area may be formed underneath said system. That open area may be formed from the underside of the structure and may be closed by covering with a suitable film in one embodiment.

REFERENCES:
patent: 6140144 (2000-10-01), Najafi et al.
patent: 2001/0055836 (2001-12-01), Kunda
patent: 0 994 330 (2000-04-01), None
Brown et al.,Micromachined Micropackaged Filter Banks and Tunable Bandpass Filters, Wireless Communications Conference, 1997, Proceedings Boulder, CO, USA Aug. 11-13, 1997, New York, NY, US, IEEE, USA, pp. 193-197.
Mayer et al.,Flip-Chip Packaging for Smart MEMS, Smart Structures and Materials, 1998, Smart Electronics and MEMS, San Diego, CA, USA Mar. 2-4, 1998, Proceedings of the SPIE-The Intl. Society for Optical Engineering, 1998, SPIE-INT. Soc. Opt. Eng., USA, pp. 183-193.
Markus et al al.,Smart MEMS: Flip Chip Integration of MEMS and Electronics, Proceedings of the SPIE, SPIE, Bellingham, VA, USA, vol. 2448, pp. 82-92.
Drayton et al.,Advanced Monolithic Packaging Concepts for High Performance Circuits and Antennas, 1996 IEEE MTT-S Intl. Microwave Symposium Digest, San Francisco, Jun. 17-21, 1996, IEEE MTT-S Intl. Microwave Symposium Digest, New York, IEEE, USA, vol. 3, pp. 1615-1618.
Park et al,Packaging of the RF-MEMS Switch, Design Characterization and Packaging of MEMS and Microelectronics II, Adelaide, SA, Australia, Dec. 17-19, 2001, Proceedings of the SPIE—The Intl. Society for Optical Engineering, 2001, SPIE-Int. Soc. Opt. Eng., USA, pp. 234-243.

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