Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2011-01-04
2011-01-04
Monbleau, Davienne (Department: 2893)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C257SE21688, C257SE21687, C257SE21680, C257SE21422, C257SE21179
Reexamination Certificate
active
07863133
ABSTRACT:
Non-volatile memory cell structures are described that are formed by a method including forming a first oxide layer on a horizontal strained substrate, forming at least one first recess through the first oxide layer to the strained substrate, and forming at least one vertical epitaxial structure in the recess. A crystal lattice of the vertical epitaxial structure is aligned with a crystal lattice of the strained substrate.
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Harrison Monica D
Micro)n Technology, Inc.
Monbleau Davienne
Schwegman Lundberg & Woessner, P.A.
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