Over-voltage test for automatic test equipment

Details Over-voltage test for automatic test equipment Over-voltage test for automatic test equipment

2005-01-14

2008-07-01

Chung, Phung M (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S703000, C714S736000

Reexamination Certificate

active

07395479

ABSTRACT:
Automatic test equipment including a digital test instrument that may test for and respond to over-voltage conditions. Information on over-voltage conditions may be used in detecting or diagnosing fault conditions within a system under test. Over-voltage conditions may be monitored as part of a test to determine the time and the channels on which they occur. A test may fail if an over-voltage condition is detected and the results of the test may indicate when and where the over-voltage condition occurred. Alternatively, indications of over-voltage conditions may be used to alter the test environment. In response to an over-voltage condition, units under test may be disconnected from the test environment to avoid exposing circuitry within those units to voltage levels that may damage or stress components. Alternatively, indications of an over-voltage condition may be used to disconnect from the test environment equipment that may be generating the over-voltage conditions. Over-voltage conditions are detected in a digital test instrument by additional comparators included in the channel electronic circuits of the test instrument.

REFERENCES:
patent: 5124849 (1992-06-01), Chur
patent: 6396742 (2002-05-01), Korsh et al.
patent: 6489798 (2002-12-01), Scott-Thomas et al.
patent: 6563352 (2003-05-01), Gohel et al.
patent: 6870384 (2005-03-01), Ricca
patent: 2004/0056666 (2004-03-01), Gohel
patent: 2004/0128121 (2004-07-01), Truebenbach et al.

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