Optimized JTAG interface

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Details

C714S727000

Reexamination Certificate

active

07900110

ABSTRACT:
An optimized JTAG interface is used to access JTAG Tap Domains within an integrated circuit. The interface requires fewer pins than the conventional JTAG interface and is thus more applicable than conventional JTAG interfaces on an integrated circuit where the availability of pins is limited. The interface may be used for a variety of serial communication operations such as, but not limited to, serial communication related integrated circuit test, emulation, debug, and/or trace operations.

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“A hierarchical test control architecture for core based design” by Lee et al. This paper appears in: Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian Publication Date: 2000 On pp. 248-253 ISBN: 0-7695-0887-1 INSPEC Accession Number: 6846335.
“Synchronizing the IEEE 1149.1 test access port for chip level testability” by Bhavsar, This paper appears in: Design & Test of Computers, IEEE Publication Date: Apr.-Jun. 2000 vol. 17, Issue: 2 On pp. 94-99 ISSN: 0740-7475 INSPEC Accession No. 6611672.

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