Optical measurement system and method

Optics: measuring and testing – Of light reflection

Reexamination Certificate

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C356S448000

Reexamination Certificate

active

07046363

ABSTRACT:
An apparatus and method for measuring feature sizes having form birefringence. The method includes providing a surface having surface features thereon; radiating the surface features with light having a first wavelength and a first polarization; measuring a reflected polarization of light having the first wavelength reflected from the surface features; rotating the surface features by rotating the surface to measure the reflected polarization of the reflected light having the first wavelength at least one new rotated position; radiating the surface features with light having a second wavelength and the first polarization; measuring a reflected polarization of light having the second wavelength reflected from the surface features; rotating the surface features by rotating the surface to measure the reflected polarization of the reflected light having the second wavelength at least one new rotated position; and correlating the reflected polarization from the light having the first and second polarizations to surface feature sizes.

REFERENCES:
patent: 6031614 (2000-02-01), Michaelis et al.
patent: 6079256 (2000-06-01), Bareket
patent: 6462818 (2002-10-01), Bareket
patent: 6483580 (2002-11-01), Xu et al.
patent: 6486951 (2002-11-01), Hirosawa et al.
patent: 6590656 (2003-07-01), Xu et al.
patent: 6638671 (2003-10-01), Ausschnitt et al.

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