Open-bottomed via liner structure and method for fabricating sam

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438637, 438639, 438648, 438687, H01L 214763

Patent

active

059337532

ABSTRACT:
This invention relates to a method of forming a bottomless liner structure. The method involves the steps of first obtaining a material having a via. Next, a first layer is deposited on the material, the first layer covering the sidewalls and bottom of the via. Finally, a second layer is sputter deposited on the first material, the material Rf biased during at least a portion of the time that the second layer is sputter deposited, such that the first layer deposited on the bottom of the via is substantially removed and substantially all of the first layer deposited on the sidewalls of the via is unaffected.

REFERENCES:
patent: 4717462 (1988-01-01), Homma et al.
patent: 4968644 (1990-11-01), Gallagher et al.
patent: 5006484 (1991-04-01), Harada
patent: 5082802 (1992-01-01), Gelsomini
patent: 5093710 (1992-03-01), Higuchi
patent: 5098860 (1992-03-01), Chakravorty
patent: 5385868 (1995-01-01), Chao et al.
patent: 5514622 (1996-05-01), Bornstein et al.
patent: 5556506 (1996-09-01), Contreras et al.
patent: 5616519 (1997-04-01), Ping
patent: 5676587 (1997-10-01), Landers et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Open-bottomed via liner structure and method for fabricating sam does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Open-bottomed via liner structure and method for fabricating sam, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Open-bottomed via liner structure and method for fabricating sam will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-859779

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.