Electronic digital logic circuitry – With test facilitating feature
Reexamination Certificate
2002-12-31
2004-11-23
Cho, James H. (Department: 2819)
Electronic digital logic circuitry
With test facilitating feature
C326S047000, C714S724000
Reexamination Certificate
active
06822474
ABSTRACT:
BACKGROUND
As higher and higher levels of circuit integration are achieved on a single chip, the complexity of the chip may increase significantly. As a result, difficulty in determining or observing internal operation of the chip or internal state information of the chip also may increase significantly. Thus, there may be a need for a system, apparatus, and method by which internal state information of a chip can be monitored and observed.
REFERENCES:
patent: 5510742 (1996-04-01), Lemaire
patent: 5550843 (1996-08-01), Yee
patent: 6157210 (2000-12-01), Zaveri et al.
Buckley Maschoff & Talwalkar LLC
Cho James H.
Intel Corporation
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