On chip logic analyzer debug bus

Electronic digital logic circuitry – With test facilitating feature

Reexamination Certificate

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Details

C326S047000, C714S724000

Reexamination Certificate

active

06822474

ABSTRACT:

BACKGROUND
As higher and higher levels of circuit integration are achieved on a single chip, the complexity of the chip may increase significantly. As a result, difficulty in determining or observing internal operation of the chip or internal state information of the chip also may increase significantly. Thus, there may be a need for a system, apparatus, and method by which internal state information of a chip can be monitored and observed.


REFERENCES:
patent: 5510742 (1996-04-01), Lemaire
patent: 5550843 (1996-08-01), Yee
patent: 6157210 (2000-12-01), Zaveri et al.

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