On chip diagnosis block with mixed redundancy

Details On chip diagnosis block with mixed redundancy On chip diagnosis block with mixed redundancy

2008-06-10

2008-06-10

Louis-Jacques, Jacques (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Replacement of memory spare location, portion, or segment

C714S718000, C714S722000, C365S201000

Reexamination Certificate

active

07386769

ABSTRACT:
On chip diagnosis method and on chip diagnosis block with mixed redundancy (IO redundancy and word-register redundancy) is provided. During a BIST (Built-In Self Test), information needed to apply redundancy resources is stored inside two arrays (fill_array, shift_array) on chip. A final diagnosis may apply redundancy resources based on this stored information. The first array (fill_array) is used to keep a minimum error mapping and the second array (shift_array) is used to control the fill of the first array.

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