Nonvolatile semiconductor memory device and a method of fabricat

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438201, 438211, 438258, 438259, 438265, 438266, 438439, 438448, 438297, 257314, 257315, 257505, 257524, 257316, 257317, H01L 21336

Patent

active

06136648&

ABSTRACT:
A method of forming a nonvolatile semiconductor memory device of the present invention comprises: an isolation film formed on a semiconductor substrate of one conductivity type; a floating gate which is formed in an active region isolated by said isolation film so as to be disposed in a gap between adjacent isolation films and make each of end portions coincident with each end of said isolation film in a self-aligned manner; a tunnel oxide film which covers said floating gate; a control gate formed on said tunnel oxide film so as to comprise a region which overlaps said floating gate; a diffusion region of an opposite conductivity type and formed in a surface of the semiconductor substrate adjacent to said floating gate and the control gate.

REFERENCES:
patent: 5045488 (1991-09-01), Yeh
patent: 5753962 (1998-05-01), Jeng
patent: 5780892 (1998-07-01), Chen
patent: 5940706 (1999-08-01), Sung et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Nonvolatile semiconductor memory device and a method of fabricat does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Nonvolatile semiconductor memory device and a method of fabricat, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Nonvolatile semiconductor memory device and a method of fabricat will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1962800

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.