Nonvolatile semiconductor memory device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257SE29001

Reexamination Certificate

active

08072021

ABSTRACT:
A memory cell includes a floating gate electrode, a first inter-electrode insulating film and a control gate electrode. A peripheral transistor includes a lower electrode, a second inter-electrode insulating film and an upper electrode. The lower electrode and the upper electrode are electrically connected via an opening provided on the second inter-electrode insulating film. The first and second inter-electrode insulating films include a high-permittivity material, the first inter-electrode insulating film has a first structure, and the second inter-electrode insulating film has a second structure different from the first structure.

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U.S. Appl. No. 12/234,150, filed Sep. 19, 2008, Tanaka, et al.
Office Action issued Aug. 31, 2010, in korea Patent Application No. 10-2008-84586 (with English Translation).

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