Static information storage and retrieval – Read/write circuit – Testing
Patent
1987-03-25
1989-11-07
Moffitt, James W.
Static information storage and retrieval
Read/write circuit
Testing
365185, 36518905, 365195, G11C 1140, G11C 2900
Patent
active
048796891
ABSTRACT:
A nonvolatile semiconductor memory device comprising a matrix array of memory cells, word lines for driving the rows of memory cells, bit lines for reading data from columns of memory cells, a plurality of first MOS transistors provided for these bit lines, respectively, a second MOS transistor having a source coupled to the bit lines by the first MOS transistors, a drain coupled to a VCC terminal, and a gate connected to receive a predetermined bias voltage, a row decoder for selecting one of the word lines in accordance with a row-address signal, and a column decoder for turning on one of the first MOS transistors in accordance with a column-address signal. The memory device further has a CE terminal for receiving a test-mode signal, an OE terminal for receiving first and second control signals, and a control circuit for detecting a test mode, thereby prohibiting the operation of the row decoder in response to the first control signal, and permitting the operation of the row decoder in response to the second control signal.
REFERENCES:
patent: 4404659 (1983-09-01), Kihara et al.
patent: 4451903 (1984-05-01), Jordan
patent: 4758984 (1988-07-01), Yoshida
Atsumi Shigeru
Otsuka Nobauki
Saito Shinji
Tanaka Sumio
Kabushiki Kaisha Toshiba
Moffitt James W.
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