Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2011-04-12
2011-04-12
Nguyen, Tuan T (Department: 2824)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S148000, C365S225700, C365S230030
Reexamination Certificate
active
07924639
ABSTRACT:
The present invention provides a nonvolatile memory device that uses a resistance material. The nonvolatile memory device includes: a stacked memory cell array having a plurality of memory cell layers stacked in a vertical direction, the stacked memory cell array having at least one memory cell group and at least one redundancy memory cell group; and a repair control circuit coupled to the stacked memory cell array, the repair control circuit configured to repair a defective one of the at least one memory cell group with a selected one of the at least one redundancy memory cell group. The features that enable repair improve the fabrication yield of the nonvolatile memory device.
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Cho Woo-Yeong
Kang Sang-Beom
Oh Hyung-Rok
Park Joon-min
Le Toan
Nguyen Tuan T
Samsung Electronics Co,. Ltd.
Volentine & Whitt PLLC
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