Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2011-04-05
2011-04-05
Ton, David (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S733000
Reexamination Certificate
active
07921340
ABSTRACT:
A life parameter generator generates life parameters related to the life of a nonvolatile memory device by using parameters related to allowable capacity for memory defect and occurrence capacity for memory defect. The life parameters are stored in a life parameter storing block of a nonvolatile memory. An access device reads and displays the stored life parameters. Thus, the user can precisely know the life of the nonvolatile memory device or the moment when a device having a built in nonvolatile memory such as a portable audio becomes unusable.
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Greenblum & Bernstein P.L.C.
Panasonic Corporation
Ton David
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