Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2007-12-04
2007-12-04
Lamarre, Guy (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S746000, C714S764000, C714S799000, C714S810000, C714S048000, C714S723000, C714S733000, C714S734000, C365S185090, C365S185330
Reexamination Certificate
active
11182781
ABSTRACT:
To provide a technique which enables a load on a controller to be reduced by rapidly detecting n-bit errors during writing/erasing on a chip in ECC in a nonvolatile memory. A flash memory of the present invention, which is a nonvolatile memory that includes plural electrically erasable and writable nonvolatile memory cells and performs write-and-verify processing in a write operation on the nonvolatile memory cells, includes an ECC determination circuit that counts the number of bits of write error detected in the write-and-verify processing, and outputs the information, and a status register for holding pass/fail information of the write operation and the information about the number of bits of write error outputted from the ECC determination circuit.
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Jono Yusuke
Kozakai Kenji
Matsushita Toru
Noda Satoshi
Lamarre Guy
Miles & Stockbridge P.C.
Trimmings John P
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