Noncontact, on-line determination of phosphate layer thickness a

Details Noncontact, on-line determination of phosphate layer thickness a Noncontact, on-line determination of phosphate layer thickness a

1992-05-14

1994-02-22

Rosenberger, Richard A.

Optics: measuring and testing

By configuration comparison

With photosensitive film or plate

356355, 356357, G01B 1106, G01B 1102

Patent

active

052892662

ABSTRACT:
A nondestructive method and apparatus is disclosed for determining the thickness and composition of a zinc phosphate layer applied to a metal surface, such as sheet metal on an automotive assembly line. The phosphate layer is irradiated with infrared light which is at least partially transmitted through the phosphate layer. Reflections from the upper and lower surfaces of the phosphate layer return a total reflected intensity which is a function of the optical parameters of the phosphate components and the ratio of the components corresponding to the optical parameters. In the event, for example, that a phosphate layer includes two zinc phosphate components, the measure of reflected intensity at two separate wavelengths will be different inasmuch as the optical properties of the zinc phosphate components is also a function of frequency. The measured reflected intensity and its functional dependence upon the ratio of the components within the phosphate layer can be taken together with the known values of the optical parameters of each component to compute the fraction of each component within the phosphate layer.

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