Non-volatile semiconductor storage device and method of...

Static information storage and retrieval – Read/write circuit – Particular write circuit

Reexamination Certificate

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C365S100000, C365S148000, C365S225700

Reexamination Certificate

active

07864602

ABSTRACT:
A non-volatile semiconductor storage device includes: a plurality of memory cells storing information based on a change in resistance value; and a plurality of first and second wirings connected to the plurality of memory cells and activated in reading data from and writing data to a certain one of the memory cells. Each of the memory cells includes: an irreversible storage element storing information based on a change in resistance value associated with breakdown of an insulation film; and a voltage booster circuit receiving an input of a voltage-boost clock performing clock operation in writing data to a certain one of the memory cells and applying a voltage-boosted signal boosted based on the voltage-boost clock to one end of the irreversible storage element.

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Kensuke Matsufuji, et al., “A 65nm Pure CMOS One-time Programmable Memory Using a Two-Port Antifuse Cell Implemented in a Matrix Structure”, IEEE Asian Solid-State Circuits Conference, Nov. 12-14, 2007; Jeju, Korea; pp. 212-215.

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