Static information storage and retrieval – Systems using particular element – Resistive
Reexamination Certificate
2011-01-11
2011-01-11
Elms, Richard (Department: 2824)
Static information storage and retrieval
Systems using particular element
Resistive
C365S100000, C365S163000, C257SE21350, C438S135000
Reexamination Certificate
active
07869255
ABSTRACT:
A non-volatile memory device includes a substrate having a recess thereon, a resistant material layer pattern in the recess, a lower electrode on the resistant material layer pattern in the recess, a dielectric layer, and an upper electrode formed on the dielectric layer. The resistant material layer pattern includes a material whose resistance varies according to an applied voltage. The dielectric layer is formed on the substrate, the resistant material layer pattern and the lower electrode. An upper electrode overlaps the resistant material layer pattern and the lower electrode. The applied voltage is applied to access the upper and lower electrodes to vary the resistance of the resistant material layer pattern.
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Choi Byung Yong
Lee Choong Ho
Park Kyu Charn
Byrne Harry W
Elms Richard
Myers Bigel & Sibley & Sajovec
Samsung Electronics Co,. Ltd.
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