Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2008-12-30
2011-10-25
Vu, Hung (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S288000, C257S326000, C257SE29309
Reexamination Certificate
active
08044453
ABSTRACT:
A non-volatile memory device includes field insulating layer patterns on a substrate to define an active region of the substrate, upper portions of the field insulating layer patterns protruding above an upper surface of the substrate, a tunnel insulating layer on the active region, a charge trapping layer on the tunnel insulating layer, a blocking layer on the charge trapping layer, first insulating layers on upper surfaces of the field insulating layer patterns, and a word line structure on the blocking layer and first insulating layers.
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Choi Dong-Uk
Kang Hee-Soo
Lee Choong-Ho
Sung Suk-Kang
Lee & Morse P.C.
Samsung Electronics Co,. Ltd.
Vu Hung
Webb Vernon P
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