Non-volatile memory device and methods of manufacturing and...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S321000, C438S259000, C438S264000

Reexamination Certificate

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07544991

ABSTRACT:
A non-volatile memory device and methods of manufacturing and operating the same are provided. In a method of manufacturing a non-volatile memory device, a substrate having a stepped portion that may include a first horizontal face, a second horizontal face lower than the first horizontal face, and a vertical face connected between the first and second horizontal faces may be prepared. A first impurity region may be formed under the first horizontal face. A tunnel insulation layer may be continuously formed on the vertical face and the second horizontal face. A floating gate electrode having a tip higher than the first horizontal face may be formed on the tunnel insulation layer. A dielectric layer may be formed on the floating gate electrode. The floating gate electrode may be covered with a control gate electrode. A second impurity region horizontally spaced apart from the floating gate electrode may be formed under the second horizontal face.

REFERENCES:
patent: 5029130 (1991-07-01), Yeh
patent: 5045488 (1991-09-01), Yeh
patent: 5338953 (1994-08-01), Wake
patent: 5869369 (1999-02-01), Hong
patent: 6693010 (2004-02-01), Mirgorodski
patent: 6888193 (2005-05-01), Huang
patent: 07-169865 (1995-07-01), None
patent: 10-107166 (1998-04-01), None

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