Non-volatile memory cell and method of manufacturing a...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S287000, C438S299000, C438S266000

Reexamination Certificate

active

07052962

ABSTRACT:
A non-volatile memory cell incorporated in an integrated circuit is disclosed. The non-volatile memory cell comprises an access transistor; a floating gate transistor coupled to the access transistor; a tunneling capacitor formed between the source of the access transistor and the gate of the second transistor; and a coupling capacitor having a first plate associated with a gate of the floating gate transistor, the first plate being formed to minimize the gate to source capacitance of the floating gate transistor. A window is also created to reduce the capacitance of the tunneling capacitor and the gate to source capacitance of the floating gate transistor. A method of manufacturing this non-volatile memory cell is also disclosed.

REFERENCES:
patent: 4408303 (1983-10-01), Guterman et al.
patent: 5248624 (1993-09-01), Icel et al.
patent: 5587945 (1996-12-01), Lin et al.
patent: 5914514 (1999-06-01), Dejenfelt et al.
patent: 6265266 (2001-07-01), Dejenfelt et al.
patent: 6660579 (2003-12-01), Jiang et al.
patent: 6700151 (2004-03-01), Peng
patent: 6841447 (2005-01-01), Logie et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Non-volatile memory cell and method of manufacturing a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Non-volatile memory cell and method of manufacturing a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Non-volatile memory cell and method of manufacturing a... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3651826

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.